{"id":134,"date":"2023-03-14T23:03:42","date_gmt":"2023-03-14T23:03:42","guid":{"rendered":"https:\/\/rffuture.com\/?page_id=134"},"modified":"2024-08-06T20:02:08","modified_gmt":"2024-08-06T20:02:08","slug":"test","status":"publish","type":"page","link":"https:\/\/rffuture.com\/?page_id=134","title":{"rendered":"Test\/ Characterization Services"},"content":{"rendered":"\n<p>RF Devices require stable and repeatable test and measurement solutions to ensure constant product quality. Wireless systems require many RF and microwave components from passives, data converters, filters, mixers, amplifiers to antennas.<\/p>\n\n\n\n<p><strong>Characterizing these devices in small lots and verifying in mass-production require flexible and fast test and measurement solutions which support basic RF measurements all the way to standard-compliant modulation schemes<\/strong>.<\/p>\n\n\n\n<p>RF Future provides leading-edge solutions for component test for on-wafer to final packaged devices, from streamlined RF test to complex protocol scenarios for production and characterization for multiple applications and technologies.<\/p>\n\n\n\n<blockquote class=\"wp-block-quote is-layout-flow wp-block-quote-is-layout-flow\">\n<h3 class=\"wp-block-heading headline-primary h3\"><strong>Our<\/strong> solutions to <strong>Your<\/strong> challenges&nbsp;<\/h3>\n<\/blockquote>\n\n\n\n<p>Characterization and production have many things in common. Actually, production testing is often derived from the characterization procedures and methods with reduced test depth.<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><span style=\"font-weight: bold;\">Ensuring product quality<\/span> while scaling from lab samples to mass deployment<\/li>\n\n\n\n<li>Automated testing with the <span style=\"font-weight: bold;\">right balance of test accuracy and speed<\/span><\/li>\n\n\n\n<li><span style=\"font-weight: bold;\">Faster to market<\/span>\u00a0with fully qualified products<\/li>\n\n\n\n<li><span style=\"font-weight: bold;\">Correlation of test results<\/span>\u00a0from development through characterization to production<\/li>\n<\/ul>\n\n\n\n<h2 class=\"wp-block-heading\">Specific requirements in characterization:<\/h2>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Characterize the lot within a\u00a0<span style=\"font-weight: bold;\">short time while maintaining a high level of accuracy and sensitivity<\/span><\/li>\n\n\n\n<li>Verify the components in a small lot\u00a0<span style=\"font-weight: bold;\">across corner cases<\/span>\u00a0in level and temperature to release for production<\/li>\n\n\n\n<li>Run\u00a0<span style=\"font-weight: bold;\">stress testing<\/span>, also called highly accelerated stress screening (HASS) and highly accelerated life cycle testing (HALT) to ensure product quality<\/li>\n<\/ul>\n\n\n\n<h2 class=\"wp-block-heading\">Specific requirements in production:<\/h2>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Enable\u00a0<span style=\"font-weight: bold;\">highest throughput\u00a0<\/span>using speed optimized testing and minimized test depth<\/li>\n\n\n\n<li>Ensure only good devices will leave the factory using the right amount of testing<\/li>\n\n\n\n<li>Find faulty units as early as possible in the production process<\/li>\n<\/ul>\n\n\n\n<p><\/p>\n","protected":false},"excerpt":{"rendered":"<p>RF Devices require stable and repeatable test and measurement solutions to ensure constant product quality. [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-134","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/rffuture.com\/index.php?rest_route=\/wp\/v2\/pages\/134","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/rffuture.com\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/rffuture.com\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/rffuture.com\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/rffuture.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=134"}],"version-history":[{"count":10,"href":"https:\/\/rffuture.com\/index.php?rest_route=\/wp\/v2\/pages\/134\/revisions"}],"predecessor-version":[{"id":317,"href":"https:\/\/rffuture.com\/index.php?rest_route=\/wp\/v2\/pages\/134\/revisions\/317"}],"wp:attachment":[{"href":"https:\/\/rffuture.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=134"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}